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Microsystems, Electronics and Acoustics
ISSN 2523-4447 · e‑ISSN 2523-4455 Open Access · CC BY-SA 4.0
Vol. 30 · Issue 1 · 2025 Feb 4, 2025 Electronic Systems and Signals

Measurement of Noise in Electronic Devices by the Fourier Transform Method

IP
Ivan V. Padalka Corresponding Дрогобицький державний педагогічний університет імені Івана Франка Ukraine
IV
Ihor Stepanovyh Virt Дрогобицький державний педагогічний університет імені Івана Франка Ukraine
Pages314855.1-314855.11 PublishedFeb 4, 2025
PDF (Ukrainian)
VOL 30 · ISS 1 · 2025 View issue

Abstract

The paper considers and analyzes the method of measuring the noise characteristics of electronic circuits and devices based on data collection by a digital oscilloscope with a built-in Fourier transform. The measurement process methodology and its analysis are demonstrated when determining the noise characteristics of industrial resistors. This includes, in particular, thermal (white) noise, which is the predominant type of resistor noise. The work includes an overview of the noise properties of resistors and existing measurement methods, as well as an understanding of the theory of such measurements. To determine the sources of noise in industrial resistors, a real-time fast Fourier transform ( FFT ) of the signal was run on an oscilloscope. Thermal (white) noise spectra were determined using the FFT tool using a total number of 2 12 points.. However, it is difficult to make any recommendations as to which setup should be used for a particular resistor type or technology, as for most setups the noise level is unknown and only a few measurement results are available. The ratio of the average value of the power spectral density ( PSD ) of thermal noise in the frequency range of measurements to its calculated theoretical value based on the ohmic rating of the measuring coal industrial resistors was estimated.

Keywords

#electronic devices #resistors #spectral analysis #Fourier transformation #thermal noise #noise diagnostics

References

  1. D. Walter, A. Bülau, A. Zimmermann “Review on Excess Noise Measurements of Resistors”, Sensors, vol.1107, no 3, pp.1-29, 2023, DOI: https://doi.org/10.3390/s23031107 .
  2. M. M. Jevtic, I. Mrak , Z. Stanimirovic “Thick-film resistor quality indicator based on noise index measurements”, Microelectronics Journal, vol. 30, no.12, pp. 1255–1259, 1999, DOI: https://doi.org/10.1016/S0026-2692(99)00050-6 .
  3. D. Rocak, D. Belavic, M. Hrovat, J. Sikula, P. Koktavy, J. Pavelka, V. Sedlakova “Low-frequency noise of thick-film resistors as quality and reliability indicator”, Microelectronics Reliability, vol. 41, no. 4, pp. 531-542, 2001, DOI: https://doi.org/10.1016/S0026-2714(00)00255-9 .
  4. M. M. Jevtic, Z. Stanimirovic, I. Stanimirovic “Evaluation of thick-film resistor structural parameters based on noise index measurements”, Microelectronics Reliability, vol. 41, no.1, pp. 59-66, 2001, DOI: https://doi.org/10.1016/S0026-2714(00)00207-9 .
  5. E. P. Vandamme, L. K. J. Vandamme “Current crowding and its efect on 1/f noise and third harmonic distortion a case study for quality assessment of resistors”, Microelectronics Reliability, vol. 40, no. 11, pp. 1847-1853, 2000, DOI: https://doi.org/10.1016/S0026-2714(00)00091-3 .
  6. L. Chen, Y. Duan, Y. Liang “Analysis of non-ideal factors for a high precision interpolated resistor string DAC”, Microelectronics Journal, vol. 143, no. 106049, pp. 1-6, 2024, DOI: https://doi.org/10.1016/j.mejo.2023.106049 .
  7. L. B. Kish “Zero-point thermal noise in resistors? a conclusion”, Metrol. Meas. Syst., vol. 26, no. 1, pp. 3–11, 2019, DOI: https://doi.org/10.24425/mms.2019.126337 .
  8. R. Tavcar, J. Bojkovski, S. Begus “Sound-card-based Johnson noise thermometer”, Measurement, vol. 225, no. 114077, pp. 1-6, 2024, DOI: https://doi.org/10.1016/j.measurement.2023.114077 .
  9. A. Ghosh “Generalised energy equipartition in electrical circuits”, Pramana – J. Phys., vol. 97, no. 82, pp.1-6, 2023, DOI: https://doi.org/10.1007/s12043-023-02553-w .
  10. I. S. Virt, I. S. Bilyk, O. A. Parfeniuk, M. I. Ilashchuk “Noise and transport properties of CdTe crystals”, Microsystems, Electronics and Acoustics, vol. 17, no. 4, pp. 5-10, 2012, DOI: https://doi.org/10.20535/2312-1807.2012.17.4.218982 .
  11. J. Kim, J. Kim, C. D. de Souza “Discrete time domain analysis of radiation detector noise”, Nuclear Inst. and Methods in Physics Research A, vol. 1021, no. 165925, pp. 1-14, 2022, DOI: https://doi.org/10.1016/j.nima.2021.165925 .
  12. O. M. Adegoke, I. B. Oluwafemi, O. Akinsanmi “A Time Domain Noise Measurement and Analysis for Broadband Indoor Power Line Communications”, Instrumentation Mesure Metrologie, vol. 19, no. 2, pp. 103-110, 2020, DOI: https://doi.org/10.18280/i2m.190204 .
  13. Z. Sita, V. Sedlakova, J. Majzner, P. Sedlak, J. Sikula , L. Grmela “Analysis of noise and non-inearity of I-V characteristics of positive temperature coefficient chip thermistors”, Metrol. Meas. Syst., vol. 20, no. 4, pp. 635–644, 2013, DOI: https://doi.org/10.2478/mms-2013-0054 .
  14. G. T. Seidler and S. A. Solin “Non-Gaussian 1/f noise: Experimental optimization and separation of high-order amplitude and phase correlations”, Physical Review B, vol. 53, no. 15, pp. 9753- 9759, 1996, DOI: https://doi.org/10.1063/1.2759716 .
  15. K. Mleczko, Z. Zawislak, A.W. Stadler, A. Kolek, A. Dziedzic, J. Cichosz “Evaluation of conductive-to-resistive layers interaction in thick-film resistors”, Microelectronics Reliability, vol. 48, no. 6, pp. 881–885, 2008, DOI: https://doi.org/10.1016/j.microrel.2008.03.012 .
  16. A. W. Stadler “Noise properties of thick-film resistors in extended temperature range”, Microelectronics Reliability, vol. 51, no. 7, pp. 1264-1270, 2011, DOI: https://doi.org/10.1016/j.microrel.2011.02.023 .
  17. Z. Balogh, G. Mezei, L. Pósa, B. Santa, A. Magyarkuti and A. Halbritter “1/f noise spectroscopy and noise tailoring of nanoelectronic devices”, Nano Futures, vol. 5, no. 4, р.1-11, 2021, DOI: https://doi.org/10.1088/2399-1984/ac14c8 .
  18. E. J. McDowell, X. Cui, Z. Yaqoob, and C. Yang “A generalized noise variance analysis model and its application to the characterization of 1/f noise”, Optics Express, vol. 15, no. 7, pp. 3833-3848, 2007, DOI: https://doi.org/10.1364/oe.15.003833 .
  19. S. Demolder, M. Vandendriessche, and A. Van Calster “The measuring of l/f noise of thick and thin film resistors”, Journal of Physics E Scientific Instruments, vol. 13, no. 12, pp. 1323-1327, 2000, DOI: https://doi.org/10.1088/0022-3735/13/12/024 .
  20. B. Stawarz−Graczyk, A. Szewczyk, and A. Konczakowska “Identification of inherent noise components of semiconductor devices on an example of optocouplers”, Opto−Electronics Review, vol. 17, no. 3, pp. 236–241, 2009, DOI: https://doi.org/10.2478/s11772-008-0073-5 .
  21. P. Sakalas, A. Šimukovič, S. Piotrowicz, O. Jardel, S. L. Delage, A. Mukherjee, A. Matulionis “Compact modelling of InAlN/GaN HEMT for low noise applications”, Semicond. Sci. Technol., vol. 29, no. 9, pp. 1- 8, 2014, DOI: https://doi.org/10.1088/0268-1242/29/9/095014 .
  22. M. S. Priyadarshini, M. Bajaj, L. Prokop, M. Berhanu “Perception of power quality disturbances using Fourier, Short Time Fourier, continuous and discrete wavelet transforms”, Scientifc Reports, vol. 14, no.1, pp. 1-40, 2024, DOI: https://doi.org/10.1038/s41598-024-53792-9 .
  23. Y. Tong, L. Wang, W.-Z. Zhang, M.-D. Zhu, X. Qin, M. Jiang, X. Rong, and J. Du “A high performance fast-Fourier-transform spectrum analyzer for measuring spin noise spectrums”, Chin. Phys. B, vol. 29, no. 9, рp. 1-8, 2020, DOI: https://doi.org/10.1088/1674-1056/ab9c04 .
  24. K. R. Rao, D. N. Kim, J. J. Hwang “Fast Fourier Transform: Algorithms and Applications”, Springer Dordrecht Heidelberg, London New York Library of Congress # Springer Science, 2010, DOI: https://doi.org/10.1007/978-1-4020-6629-0 .
  25. U. Meyer-Base, H. Natarajan, A. G. Dempster “Fast Discrete Fourier Transform Computations Using the Reduced Adder Graph Technique”, Eurasip Journal on Advances in Signal Processing, vol. ID 67360, pp. 1-8, 2007, DOI: https://doi.org/10.1155/2007/67360 .
  26. K. Sozanski “Overview of Signal Processing Problems in Power Electronic Control Circuits”, Energies, vol. 16, no. 4774. рp.1-26, 2023, DOI: https://doi.org/10.3390/en16124774 .
  27. E. Serrano-Finetti, O. Casas, R. P. Areny “Common mode electronic noise in differential circuits”, Measurement, vol. 140, no.7, pp. 207-214, 2019, DOI: https://doi.org/10.1016/j.measurement.2019.04.028 .
  28. P. Ashdhir, J. Arya, C. E. Rani and A. Eur “Exploring the fundamentals of fast Fourier transform technique and its elementary applications in physics”, J. Phys., vol. 42, no. 065805, pp. 1- 28, 2021, DOI: https://doi.org/10.1088/1361-6404/ac20ad .
  29. M. A. Ogunlade, S. L. Gbadamosi, I. E. Owolabi, N. I. Nwulu “Noise Measurement, Characterization, and Modeling for Broadband Indoor Power Communication System: A Comprehensive Survey “, Energies, vol. 16, no. 1535, 2023, pp. 1-26, DOI: https://doi.org/10.3390/en16031535 .
  30. I. Stanimirovic, M. M. Jevtic, Z. Stanimirovic “High-voltage pulse stressing of thick-film resistors and noise”, Microelectronics Reliability, vol. 38, no. 10, pp. 1569-1576, 1998, DOI: https://doi.org/10.1016/S0026-2714(98)00032-8 .
  31. I. Mrak, M. Jevtic, and Z. Stanimirovic, “Low-frequency noise in thick-film structures caused by traps in glass barriers”, in 1997 21st International Conference on Microelectronics. Proceedings, Nis, Yugoslavia, 1997, pp. 413–416., DOI: https://doi.org/10.1109/ICMEL.1997.625281 .
  32. L. K. J. Vandamme, A. J. Van Kemenade “Resistance noise measurement: A better diagnostic tool to detect stress and current induced degradation”, Microelectronics Reliability, vol. 37, no. 1, pp. 87-93, 1997, DOI: https://doi.org/10.1016/0026-2714(96)00241-7 .
  33. T.-Y. Lin, R.J. Green, P.B. O’Connor “A low noise single-transistor transimpedance preamplifier for Fourier-transform mass spectrometry using a T feedback network”, Rev. Sci. Instrum. vol. 83, no. 094102, pp. 1-7, 2012, DOI: https://doi.org/10.1063/1.4751851
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